TY  - RPRT
TI  - Insulating behavior in ultra-thin bismuth selenide field effect transistors
AU  - Sungjae Cho
AU  - Nicholas P. Butch
AU  - Johnpierre Paglione
AU  - Michael S. Fuhrer
PY  - 2012
DO  - 10.1021/nl200017f
UR  - https://arxiv.org/abs/1201.3908
ID  - 1201.3908
ER  -