TY  - RPRT
TI  - Simulation study of a highly efficient, high resolution X-ry sensor based on self-organizing aluminum oxide
AU  - Joerg Muehlbauer
AU  - Frank Sukowski
AU  - Nils Reims
AU  - Peter Krueger
AU  - Juergen Schreiber
AU  - Nikolai I. Mukhurov
AU  - Norman Uhlmann
PY  - 2012
DO  - 10.1088/1748-0221/7/01/c01095
UR  - https://arxiv.org/abs/1201.4660
ID  - 1201.4660
ER  -