@misc{indiciae2b1480bf6ea3,
  title = {Temperature-dependent electron microscopy study of Au thin films on Si (100) with and without native oxide layer as barrier at the interface},
  author = {Ashutosh Rath and J. K. Dash and R. R. Juluri and A Rosenauer and P V Satyam},
  year = {2012},
  doi = {10.1088/0022-3727/44/11/115301},
  url = {https://arxiv.org/abs/1202.0647},
  note = {Source identifier: 1202.0647}
}