TY  - RPRT
TI  - Temperature-dependent electron microscopy study of Au thin films on Si (100) with and without native oxide layer as barrier at the interface
AU  - Ashutosh Rath
AU  - J. K. Dash
AU  - R. R. Juluri
AU  - A Rosenauer
AU  - P V Satyam
PY  - 2012
DO  - 10.1088/0022-3727/44/11/115301
UR  - https://arxiv.org/abs/1202.0647
ID  - 1202.0647
ER  -