TY  - RPRT
TI  - Limitations of X-ray reflectometry in the presence of surface contamination
AU  - David L. Gil
AU  - Donald Windover
PY  - 2012
DO  - 10.1088/0022-3727/45/23/235301
UR  - https://arxiv.org/abs/1203.2880
ID  - 1203.2880
ER  -