TY  - RPRT
TI  - High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy
AU  - Vidya Kochat
AU  - Atindra Nath Pal
AU  - Sneha E. S.
AU  - Arjun B. S.
AU  - Anshita Gairola
AU  - S. A. Shivashankar
AU  - Srinivasan Raghavan
AU  - Arindam Ghosh
PY  - 2012
DO  - 10.1063/1.3608062
UR  - https://arxiv.org/abs/1203.5983
ID  - 1203.5983
ER  -