@misc{indiciae79b1fb6fa67f,
  title = {Physical insight into reduced surface roughness scattering in strained silicon inversion layers},
  author = {Chris Bowen and Ryan Hatcher},
  year = {2012},
  doi = {10.1063/1.4742772},
  url = {https://arxiv.org/abs/1204.1229},
  note = {Source identifier: 1204.1229}
}