TY  - RPRT
TI  - Physical insight into reduced surface roughness scattering in strained silicon inversion layers
AU  - Chris Bowen
AU  - Ryan Hatcher
PY  - 2012
DO  - 10.1063/1.4742772
UR  - https://arxiv.org/abs/1204.1229
ID  - 1204.1229
ER  -