TY  - RPRT
TI  - Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by neutron reflectometry
AU  - S. S. Jahromi
AU  - S. F. Masoudi
PY  - 2012
DO  - 10.5488/cmp.15.13604
UR  - https://arxiv.org/abs/1204.5825
ID  - 1204.5825
ER  -