@misc{indiciaecaf01ad503bd,
  title = {Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements},
  author = {S. Hellmüller and M. Pikulski and T. Müller and B. Küng and G. Puebla-Hellmann and A. Wallraff and M. Beck and K. Ensslin and T. Ihn},
  year = {2012},
  doi = {10.1063/1.4739248},
  url = {https://arxiv.org/abs/1206.1785},
  note = {Source identifier: 1206.1785}
}