@misc{indiciaecb2758fc5c31,
  title = {Gate Stack Dielectric Degradation of Rare-Earth Oxides Grown on High Mobility Ge Substrates},
  author = {Md. Shahinur Rahman and Evangelos K. Evangelou and Nikos Konofaos and A. Dimoulas},
  year = {2012},
  doi = {10.1063/1.4763478},
  url = {https://arxiv.org/abs/1206.1887},
  note = {Source identifier: 1206.1887}
}