TY  - RPRT
TI  - Gate Stack Dielectric Degradation of Rare-Earth Oxides Grown on High Mobility Ge Substrates
AU  - Md. Shahinur Rahman
AU  - Evangelos K. Evangelou
AU  - Nikos Konofaos
AU  - A. Dimoulas
PY  - 2012
DO  - 10.1063/1.4763478
UR  - https://arxiv.org/abs/1206.1887
ID  - 1206.1887
ER  -