TY  - RPRT
TI  - Fabrication and Electrical Characterization of Fully CMOS Si Single Electron Devices
AU  - P. J. Koppinen
AU  - M. D. Stewart, Jr.
AU  - Neil M. Zimmerman
PY  - 2012
DO  - 10.1109/ted.2012.2227322
UR  - https://arxiv.org/abs/1206.2872
ID  - 1206.2872
ER  -