@misc{indiciae3bdd0f413a18,
  title = {Excess noise in scanning tunneling microscope-style break junctions at room temperature},
  author = {Ruoyu Chen and Patrick Wheeler and D. Natelson},
  year = {2012},
  doi = {10.1103/physrevb.85.235455},
  url = {https://arxiv.org/abs/1206.4338},
  note = {Source identifier: 1206.4338}
}