TY  - RPRT
TI  - Excess noise in scanning tunneling microscope-style break junctions at room temperature
AU  - Ruoyu Chen
AU  - Patrick Wheeler
AU  - D. Natelson
PY  - 2012
DO  - 10.1103/physrevb.85.235455
UR  - https://arxiv.org/abs/1206.4338
ID  - 1206.4338
ER  -