TY  - RPRT
TI  - Poisoning of magnetism in silicon doped with Re, caused by a charge transfer from interstitials to substitutionals, by means of the self-interaction corrected density-functional approach
AU  - Malgorzata Wierzbowska
PY  - 2012
DO  - 10.1063/1.47340000
UR  - https://arxiv.org/abs/1207.3061
ID  - 1207.3061
ER  -