TY  - RPRT
TI  - Stress-induced patterns in ion-irradiated Silicon: a model based on anisotropic plastic flow
AU  - Scott A. Norris
PY  - 2012
DO  - 10.1103/physrevb.86.235405
UR  - https://arxiv.org/abs/1207.5754
ID  - 1207.5754
ER  -