@misc{indiciaec5bf3442a45d,
  title = {Charge losses in segmented silicon sensors at the Si-SiO2 interface},
  author = {Thomas Poehlsen and Eckhart Fretwurst and Robert Klanner and Sergej Schuwalow and Jörn Schwandt and Jiaguo Zhang},
  year = {2012},
  doi = {10.1016/j.nima.2012.10.063},
  url = {https://arxiv.org/abs/1207.6538},
  note = {Source identifier: 1207.6538}
}