TY  - RPRT
TI  - Charge losses in segmented silicon sensors at the Si-SiO2 interface
AU  - Thomas Poehlsen
AU  - Eckhart Fretwurst
AU  - Robert Klanner
AU  - Sergej Schuwalow
AU  - Jörn Schwandt
AU  - Jiaguo Zhang
PY  - 2012
DO  - 10.1016/j.nima.2012.10.063
UR  - https://arxiv.org/abs/1207.6538
ID  - 1207.6538
ER  -