TY  - RPRT
TI  - An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance
AU  - Philippe Jonnard
AU  - Karine Le Guen
AU  - Jean-Michel André
AU  - Jean-René Coudevylle
AU  - Nathalie Isac
PY  - 2012
DO  - 10.1002/xrs.2398
UR  - https://arxiv.org/abs/1208.6404
ID  - 1208.6404
ER  -