TY  - RPRT
TI  - Thermal Contact Resistance Across Nanoscale Silicon Dioxide and Silicon Interface
AU  - Jie Chen
AU  - Gang Zhang
AU  - Baowen Li
PY  - 2012
DO  - 10.1063/1.4754513
UR  - https://arxiv.org/abs/1210.0354
ID  - 1210.0354
ER  -