@misc{indiciae88bf9af1e447,
  title = {Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFEL},
  author = {Jiaguo Zhang and Eckhart Fretwurst and Robert Klanner and Ioana Pintilie and Joern Schwandt and Monica Turcato},
  year = {2012},
  doi = {10.1088/1748-0221/7/12/c12012},
  url = {https://arxiv.org/abs/1210.0427},
  note = {Source identifier: 1210.0427}
}