TY  - RPRT
TI  - Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFEL
AU  - Jiaguo Zhang
AU  - Eckhart Fretwurst
AU  - Robert Klanner
AU  - Ioana Pintilie
AU  - Joern Schwandt
AU  - Monica Turcato
PY  - 2012
DO  - 10.1088/1748-0221/7/12/c12012
UR  - https://arxiv.org/abs/1210.0427
ID  - 1210.0427
ER  -