TY  - RPRT
TI  - Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization
AU  - Enric Garcia-Caurel
AU  - Antonello De Martino
AU  - Jean-Paul Gaston
AU  - Li Yan
PY  - 2013
DO  - 10.1366/12-06883
UR  - https://arxiv.org/abs/1210.1076
ID  - 1210.1076
ER  -