@misc{indiciaee4eb6e0c8116,
  title = {Reliable transport through a microfabricated X-junction surface-electrode ion trap},
  author = {Kenneth Wright and Jason M. Amini and Daniel L. Faircloth and Curtis Volin and S. Charles Doret and Harley Hayden and C. -S. Pai and David W. Landgren and Douglas Denison and Tyler Killian and Richart E. Slusher and Alexa W. Harter},
  year = {2013},
  doi = {10.1088/1367-2630/15/3/033004},
  url = {https://arxiv.org/abs/1210.3655},
  note = {Source identifier: 1210.3655}
}