TY  - RPRT
TI  - Optical Absorption Measurements on Crystalline Silicon at 1550nm
AU  - Jessica Steinlechner
AU  - Christoph Krüger
AU  - Nico Lastzka
AU  - Sebastian Steinlechner
AU  - Alexander Khalaidovski
AU  - Roman Schnabel
PY  - 2013
DO  - 10.1088/0264-9381/30/9/095007
UR  - https://arxiv.org/abs/1210.7763
ID  - 1210.7763
ER  -