TY  - RPRT
TI  - Structural characterization of as-deposited cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques
AU  - Triloki
AU  - P. Garg
AU  - R. Rai
AU  - B. K. Singh
PY  - 2013
UR  - https://arxiv.org/abs/1211.5540
ID  - 1211.5540
ER  -