@misc{indiciae64104e07862a,
  title = {Self-Consistent C-V Characterization of Depletion Mode Buried Channel InGaAs/InAs Quantum Well FET Incorporating Strain Effects},
  author = {Imtiaz Ahmed and Iftikhar Ahmad Niaz and Md. Hasibul Alam and Nadim Chowdhury and Zubair Al Azim and Quazi Deen Mohd Khosru},
  year = {2012},
  doi = {10.1109/icedsa.2012.6507820},
  url = {https://arxiv.org/abs/1211.6017},
  note = {Source identifier: 1211.6017}
}