TY  - RPRT
TI  - GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures
AU  - V. Asha
AU  - N. U. Bhajantri
AU  - P. Nagabhushan
PY  - 2012
DO  - 10.1504/ijcvr.2011.045267
UR  - https://arxiv.org/abs/1212.0383
ID  - 1212.0383
ER  -