TY  - RPRT
TI  - Analysis of a combined influence of substrate wetting and surface electromigration on a thin film stability and dynamical morphologies
AU  - Mikhail Khenner
PY  - 2013
DO  - 10.1016/j.crhy.2013.06.009
UR  - https://arxiv.org/abs/1212.1141
ID  - 1212.1141
ER  -