TY  - RPRT
TI  - Measurement of specific contact resistivity using scanning voltage probes
AU  - Weigang Wang
AU  - Malcolm R. Beasley
PY  - 2013
DO  - 10.1063/1.4796175
UR  - https://arxiv.org/abs/1212.4182
ID  - 1212.4182
ER  -