@misc{indiciae57418a0fe8f3,
  title = {Using x-ray diffraction to identify precipitates in transition metal doped semiconductors},
  author = {Shengqiang Zhou and K. Potzger and G. Talut and J. von Borany and W. Skorupa and M. Helm and J. Fassbender},
  year = {2013},
  doi = {10.1063/1.2828710},
  url = {https://arxiv.org/abs/1301.0100},
  note = {Source identifier: 1301.0100}
}