TY  - RPRT
TI  - Using x-ray diffraction to identify precipitates in transition metal doped semiconductors
AU  - Shengqiang Zhou
AU  - K. Potzger
AU  - G. Talut
AU  - J. von Borany
AU  - W. Skorupa
AU  - M. Helm
AU  - J. Fassbender
PY  - 2013
DO  - 10.1063/1.2828710
UR  - https://arxiv.org/abs/1301.0100
ID  - 1301.0100
ER  -