@misc{indiciae1666e8f04498,
  title = {Single Defect Center Scanning Near-Field Optical Microscopy on Graphene},
  author = {J. Tisler and T. Oeckinghaus and R. Stöhr and R. Kolesov and F. Reinhard and J. Wrachtrup},
  year = {2013},
  doi = {10.1021/nl401129m},
  url = {https://arxiv.org/abs/1301.0218},
  note = {Source identifier: 1301.0218}
}