TY  - RPRT
TI  - Single Defect Center Scanning Near-Field Optical Microscopy on Graphene
AU  - J. Tisler
AU  - T. Oeckinghaus
AU  - R. Stöhr
AU  - R. Kolesov
AU  - F. Reinhard
AU  - J. Wrachtrup
PY  - 2013
DO  - 10.1021/nl401129m
UR  - https://arxiv.org/abs/1301.0218
ID  - 1301.0218
ER  -