@misc{indiciae8efcf9cd8604,
  title = {Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials},
  author = {Donald Windover and David L. Gil and Yasushi Azuma and Toshiyuki Fujimoto},
  year = {2013},
  doi = {10.1088/0957-0233/25/10/105007},
  url = {https://arxiv.org/abs/1301.7447},
  note = {Source identifier: 1301.7447}
}