TY  - RPRT
TI  - Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials
AU  - Donald Windover
AU  - David L. Gil
AU  - Yasushi Azuma
AU  - Toshiyuki Fujimoto
PY  - 2013
DO  - 10.1088/0957-0233/25/10/105007
UR  - https://arxiv.org/abs/1301.7447
ID  - 1301.7447
ER  -