TY  - RPRT
TI  - Using Bayesian Analysis and Gaussian Processes to Infer Electron Temperature and Density Profiles on the MAST Experiment
AU  - G. T. von Nessi
AU  - M. J. Hole
PY  - 2013
DO  - 10.1063/1.4811378
UR  - https://arxiv.org/abs/1301.7487
ID  - 1301.7487
ER  -