TY  - RPRT
TI  - Friction force microscopy: a simple technique for identifying graphene on rough substrates and mapping the orientation of graphene grains on copper
AU  - Alexander J. Marsden
AU  - Mick Phillips
AU  - Neil R. Wilson
PY  - 2013
DO  - 10.1088/0957-4484/24/25/255704
UR  - https://arxiv.org/abs/1302.0177
ID  - 1302.0177
ER  -