@misc{indiciaedd67a01d4754,
  title = {Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers},
  author = {Vinod K. Sangwan and Deep Jariwala and Stephen A. Filippone and Hunter J. Karmel and James E. Johns and Justice M. P. Alaboson and Tobin J. Marks and Lincoln J. Lauhon and Mark C. Hersam},
  year = {2013},
  doi = {10.1021/nl3045553},
  url = {https://arxiv.org/abs/1302.2263},
  note = {Source identifier: 1302.2263}
}