TY  - RPRT
TI  - Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers
AU  - Vinod K. Sangwan
AU  - Deep Jariwala
AU  - Stephen A. Filippone
AU  - Hunter J. Karmel
AU  - James E. Johns
AU  - Justice M. P. Alaboson
AU  - Tobin J. Marks
AU  - Lincoln J. Lauhon
AU  - Mark C. Hersam
PY  - 2013
DO  - 10.1021/nl3045553
UR  - https://arxiv.org/abs/1302.2263
ID  - 1302.2263
ER  -