TY  - RPRT
TI  - Finite element analysis of surface-stress effects in the Si lattice-parameter measurement
AU  - Carlo Sasso
AU  - Danilo Quagliotti
AU  - Enrico Massa
AU  - Giovanni Mana
AU  - Ulrich Kuetgens
PY  - 2013
UR  - https://arxiv.org/abs/1302.4578
ID  - 1302.4578
ER  -