TY  - RPRT
TI  - Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs
AU  - Jiangjiang J. Gu
AU  - Xinwei Wang
AU  - Heng Wu
AU  - Roy G. Gordon
AU  - Peide D. Ye
PY  - 2013
DO  - 10.1109/led.2013.2248114
UR  - https://arxiv.org/abs/1302.5660
ID  - 1302.5660
ER  -