@misc{indiciae633ba736b517,
  title = {Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation},
  author = {Amit Kumar Sahoo and Sébastien Fregonese and Mario Weiß and Nathalie Malbert and Thomas Zimmer},
  year = {2013},
  doi = {10.1109/essderc.2011.6044190},
  url = {https://arxiv.org/abs/1303.4641},
  note = {Source identifier: 1303.4641}
}