TY  - RPRT
TI  - Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation
AU  - Amit Kumar Sahoo
AU  - Sébastien Fregonese
AU  - Mario Weiß
AU  - Nathalie Malbert
AU  - Thomas Zimmer
PY  - 2013
DO  - 10.1109/essderc.2011.6044190
UR  - https://arxiv.org/abs/1303.4641
ID  - 1303.4641
ER  -