TY  - RPRT
TI  - A low cost scheme for high precision dual-wavelength laser metrology
AU  - Yitping Kok
AU  - Michael J. Ireland
AU  - J. Gordon Robertson
AU  - Peter G. Tuthill
AU  - Benjamin A. Warrington
AU  - William J. Tango
PY  - 2013
DO  - 10.1364/ao.52.002808
UR  - https://arxiv.org/abs/1304.0086
ID  - 1304.0086
ER  -