TY  - RPRT
TI  - Adaptive refinement and selection process through defect localization for reconstructing an inhomogeneous refraction index
AU  - Yann Grisel
AU  - Jean-Pierre Raymond
AU  - Pierre-Alain Mazet
AU  - Vincent Mouysset
PY  - 2014
DO  - 10.1088/0266-5611/30/7/075003
UR  - https://arxiv.org/abs/1304.4743
ID  - 1304.4743
ER  -