TY  - RPRT
TI  - Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop
AU  - Justin Iveland
AU  - Lucio Martinelli
AU  - Jacques Peretti
AU  - James S. Speck
AU  - Claude Weisbuch
PY  - 2013
DO  - 10.1103/physrevlett.110.177406
UR  - https://arxiv.org/abs/1304.5469
ID  - 1304.5469
ER  -