TY  - RPRT
TI  - Comment on "Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop" [Phys. Rev. Lett. 110, 177406 (2013)]
AU  - Francesco Bertazzi
AU  - Michele Goano
AU  - Xiangyu Zhou
AU  - Marco Calciati
AU  - Giovanni Ghione
AU  - Masahiko Matsubara
AU  - Enrico Bellotti
PY  - 2013
UR  - https://arxiv.org/abs/1305.2512
ID  - 1305.2512
ER  -