TY  - RPRT
TI  - Thin films thickness Measurement by the conductivity theory in the framework of born approximation
AU  - M. Jannesar
AU  - G. R. Jafari
AU  - S. Vasheghani Farahani
AU  - S. Moradi
PY  - 2013
DO  - 10.1016/j.tsf.2014.04.070
UR  - https://arxiv.org/abs/1305.7161
ID  - 1305.7161
ER  -